Single rhino measurement to obtain all parameters of optical devices
Complete device characterization in 3 seconds
Complete polarization response
Single scan allows simultaneous measurement of.
-Loss (IL and RL)
-Dispersion (CD)
-Group delay (GD)
-Polarization dependent loss (PDL)
-Polarization mode dispersion (PMD) and second order PMD -Optical time domain response
-Jones matrix
-Optical phase response
Real-time measurements
User-friendly interface
High resolution C and L-band (OVA5100) or O-band (OVA5113) test capability
Analysis of planar optical waveguides and silicon optical devices
Fiber optic device diurnal measurement
Simultaneous measurement of time domain and frequency domain response
Obtain complete optical transfer functions that can be used to improve device simulations and models
